ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,609, issued on March 17, was assigned to NVIDIA Corp. (Santa Clara, Calif.). "High resolution input processing in a neural network" was in... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,581,947, issued on March 17, was assigned to Hitachi Astemo Ltd. (Hitachinaka, Japan). "Power semiconductor device, power conversion device, a... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,201, issued on March 17, was assigned to NISSAN NORTH AMERICA INC. (Franklin, Tenn.). "Situational complexity determination system" was in... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,581,731, issued on March 17, was assigned to BOE TECHNOLOGY GROUP Co. LTD. (Beijing). "Array substrate, method for manufacturing the array sub... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,155, issued on March 17, was assigned to Walmart Apollo LLC (Bentonville, Ark.). "Systems and methods for interface generation using explo... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,577,661, issued on March 17, was assigned to RTX Corp. (Farmington, Conn.). "Method of forming a coating system" was invented by Paul Sheedy (... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,577,728, issued on March 17, was assigned to Colorifix Ltd. (Cambridge, Great Britain). "Method of dyeing fabric using microorganisms" was inv... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,581,951, issued on March 17, was assigned to DENSO Corp. (Kariya-city, Japan), TOYOTA JIDOSHA K.K. (Toyota, Japan) and MIRISE Technologies Corp... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,575,887, issued on March 17, was assigned to ARTHREX INC. (Naples, Fla.). "Surgical systems, anatomical models and associated methods" was inv... और पढ़ें
ALEXANDRIA, Va., March 17 -- United States Patent no. 12,581,338, issued on March 17, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Method and apparatus for beam measurement ... और पढ़ें